Chip size image sensor in wirebond package with step-up ring for electrical contact

ABSTRACT

An image sensor package includes an image sensor having an upper surface. The image sensor further includes an active area and bond pads on the upper surface. A window is supported above the active area by a window support. A step up ring is mounted above a noncritical region of the upper surface of the image sensor between the active area and the bond pads. Electrically conductive traces on the step up ring are electrically connected to the bond pads by bond wires. An inner package body is formed between the step up ring and the window support and mechanically locks the window in place. An outer package body is formed to enclose the bond wires, the bond pads, and outer sides of the step up ring. The outer package body has outer sides coplanar with sides of the image sensor such that the image sensor assembly is chip size.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates generally to the packaging of electroniccomponents. More particularly, the present invention relates to an imagesensor package.

2. Description of the Related Art

Image sensors are well known to those of skill in the art. An imagesensor included an active area, which was responsive to electromagneticradiation. To avoid obstructing or distorting the electromagneticradiation which struck the active area of the image sensor, it wasimportant to avoid contamination, e.g., from dust, of the active area.

Image sensors were fabricated from a silicon wafer. More particularly, aplurality of image sensors were formed in a single silicon wafer. Thesilicon wafer was singulated, sometimes called cut-up or diced, toseparate the image sensors from one another. However, during this wafersingulation, silicon shards were generated. These silicon shards had atendency to contaminate and scratch the active areas of the imagesensors. As a result, image sensors were damaged or destroyed, whichundesirably decreased the yield. However, to reduce cost, it isimportant to have a high yield.

The singulated image sensor was then used to fabricate an image sensorassembly. In this assembly, the image sensor was located within ahousing, which supported a window. Radiation passed through the windowand struck the active area of the image sensor, which responded to theradiation.

In one prior art assembly, an image sensor was mounted to a printedcircuit mother board. After the image sensor was mounted, a housing wasmounted around the image sensor and to the print circuit mother board.This housing provided a hermetic like seal around the image sensor,while at the same time, supported a window above the image sensor.

As the art moves to smaller and lighter weight electronic devices, itbecomes increasingly important that the size of the image sensorassembly used within these electronic devices is small.Disadvantageously, the conventional image sensor assembly describedabove required a housing to support the window and to hermetically sealthe image sensor. However, this housing was relatively bulky andextended upwards from the printed circuit mother board a significantdistance, e.g., 0.100 inches (2.54 mm) to 0.120 inches (3.05 mm) ormore. As a result, the image sensor assembly was relatively large.

In the event that moisture was trapped inside of the housing, defectiveoperation or failure of the image sensor assembly was observed. Moreparticularly, the moisture had a tendency to condense within the housingand on the interior surface of the window. Even if the housing laterdried out, a stain was left on the window. In either event,electromagnetic radiation passing through the window was distorted orobstructed by either moisture condensation or stain, which resulted indefective operation or failure of the image sensor assembly. For thisreason, an important characteristic was the temperature at whichcondensation formed within the housing of the image sensor assembly,i.e., the dew point of the image sensor assembly. In particular, it wasimportant to have a low dew point to insure satisfactory performance ofthe image sensor assembly over a broad range of temperatures.

SUMMARY OF THE INVENTION

In accordance with the present invention, an image sensor assembly,sometimes called an image sensor package, includes an image sensorhaving an upper surface. The image sensor further~includes an activearea and bond pads on the upper surface. The upper surface includes anoncritical region between the active area and the bond pads. A step upring is mounted above the noncritical region. Electrically conductivetraces on the step up ring are electrically connected to the bond padsby bond wires.

In one embodiment, a window is supported above the active area by awindow support. The step up ring has a central aperture and is mountedaround the window such that the window is located in or adjacent thecentral aperture. An inner package body, e.g., formed of an encapsulant,fills the central aperture and encloses sides of the window, thusmechanically locking the window in place.

The image sensor assembly further includes an outer package body, e.g.,formed of an encapsulant. The outer package body encloses the bond padsand the bond wires. The outer package body has outer sides coplanar withsides of the image sensor. Advantageously, the image sensor assembly isthe size of the image sensor, i.e., the image sensor assembly is chipsize. Since the image sensor assembly is chip size, the image sensorassembly is extremely well suited for use with miniature lightweightelectronic devices, which require small and lightweight image sensorassemblies.

In accordance with an alternative embodiment, an image sensor assemblyincludes an image sensor having an upper surface. The image sensorincludes an active area and a bond pad on the upper surface of the imagesensor. A step up ring includes an electrically conductive interiortrace on a lower surface of the step up ring. The step up ring ismounted to the image sensor by an electrically conductive bump betweenthe bond pad and the interior trace, i.e., the step up ring is flip chipmounted to the image sensor.

Also in accordance with present invention, a method includes mounting awindow above an active area on an upper surface of an image sensor. Abond pad is on the upper surface of the image sensor and a noncriticalregion of the upper surface of the image sensor is between the bond padand the active area. The method further includes mounting a step up ringabove the noncritical region. A trace on the step up ring iselectrically connected to the bond pad, for example, with a bond wire.

In one embodiment, the step up ring includes a central aperture and ismounted around the window such that the window is located in or adjacentto the central aperture. The central aperture is filled with anencapsulant to form an inner package body. An outer package body isformed to enclose the bond wire between the trace and the bond pad.

In another embodiment, a method includes mounting a window above anactive area on an upper surface of an image sensor, the image sensorcomprising a bond pad on the upper surface. An interior trace on a lowersurface of a step up ring is aligned with the bond pad. A bump is formedbetween the interior trace and the bond pad to mount the step up ring tothe image sensor.

In yet another alternative embodiment, windows are mounted above activeareas on upper surfaces of image sensors integrally connected togetheras part of an image sensor substrate. A sheet includes step up ringsintegrally connected together. The sheet is aligned with an image sensorsubstrate. The sheet is mounted to the image sensor substrate by bumps,wherein the windows are located in or adjacent central apertures of thestep up rings.

These and other features and advantages of the present invention will bemore readily apparent from the detailed description set forth belowtaken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a partial perspective view, partially cutaway, of an imagesensor assembly in accordance with the present invention.

FIG. 2 is a cross-sectional view of the assembly along the line II—II ofFIG. 1.

FIGS. 3, 4, 5 and 6 are cross-sectional views of image sensor assembliesin accordance with alternative embodiments of the present invention.

FIGS. 7A, 7B, 7C, 7D and 7E are cross-sectional views of structuresduring the fabrication of a plurality of image sensor assemblies inaccordance with alternative embodiments of the present invention.

FIGS. 8A, 9, 10 and 11 are cross-sectional views of the structure ofFIG. 7A at further stages of fabrication in accordance with the presentinvention.

FIG. 8B is a cross-sectional view of the structure of FIG. 7B at afurther stage of fabrication in accordance with one embodiment of thepresent invention.

FIG. 12 is a cross-sectional view of an image sensor assembly inaccordance with an alternative embodiment of the present invention.

FIG. 13 is a cross-sectional view of the structure of FIG. 7A at afurther stage of fabrication in accordance with another embodiment ofthe present invention.

FIG. 14 is a cross-sectional view of the structure of FIG. 13 at afurther state of fabrication.

In the following description, the same or similar elements are labeledwith the same or similar reference numbers.

DETAILED DESCRIPTION

An image sensor assembly 100 (FIGS. 1, 2), sometimes called an imagesensor package, includes an image sensor 102 having an upper surface102U. Image sensor 102 further includes an active area 104 and bond pads106 on upper surface 102U. A window 110 is supported above active area104 by a window support 108. A step up ring 120 is mounted above anoncritical region NCR of upper surface 102U of image sensor 102 betweenactive area 104 and bond pads 106. Electrically conductive traces 122 onstep up ring 120 are electrically connected to bond pads 106 by bondwires 124. Advantageously, use of step up ring 120 allowsinterconnection balls 126 formed on traces 122 to have minimum size andpitch. This may be important, for example, when a large number ofinterconnection balls 126 must be provided in a limited area.

An inner package body 140 (FIG. 2) is formed between step up ring 120and window support 108 and mechanically locks window 110 in place. Anouter package body 150 is formed to enclose bond wires 124, bond pads106, and outer sides 120S of step up ring 120. Advantageously, imagesensor assembly 100 is chip size and is extremely well-suited for usewith miniature lightweight electronic devices, which require small andlightweight image sensor assemblies.

More particularly, FIG. 1 is a partial perspective view, partiallycutaway, of an image sensor assembly 100 (hereinafter assembly 100) inaccordance with the present invention. FIG. 2 is a cross-sectional viewof assembly 100 along the line II—II of FIG. 1. Assembly 100 issometimes referred to as an image sensor package.

Referring to FIGS. 1 and 2 together, assembly 100 includes an imagesensor 102, sometimes called a sensor device. Image sensor 102 includesan active area 104, sometimes called an image array. Active area 104 ison an upper, e.g., first, surface 102U of image sensor 102. Image sensor102 further includes a lower, e.g., second, surface 102L, opposite uppersurface 102U, and sides 102S extending between upper surface 102U andlower surface 102L.

Generally, active area 104 is responsive to radiation, e.g.,electromagnetic radiation, as is well known to those of skill in theart. For example, active area 104 is responsive to infrared radiation,ultraviolet light, and/or visible light. Illustratively, image sensor102 is a CMOS image sensor device, a charge coupled device (CCD), apyroelectric ceramic on CMOS device, or an erasable programmableread-only memory device (EPROM) although other image sensors are used inother embodiments.

Image sensor 102 further includes a plurality of bond pads 106 on uppersurface 102U of image sensor 102. Bond pads 106 are connected to theinternal circuitry of image sensor 102. Further, active area 104 islocated inwards of bond pads 106.

Formed on active area 104 is a window support 108. More particularly,window support 108 contacts and entirely encloses active area 104 yetdoes not extend over bond pads 106. Generally, window support 108 istransparent to the radiation of interest, e.g., to the radiation towhich active area 104 of image sensor 102 is responsive, as those ofskill in the art will understand. In one particular embodiment, windowsupport 108 is MasterSil product grade 151 silicone epoxy available fromMasterbond Inc. located in Hackensack, N.J.

Window support 108 is in contact with and secures a window 110 to uppersurface 102U of image sensor 102. Window support 108 supports window 110above active area 104. Window 110 includes an interior, e.g., first,surface 110I and an exterior, e.g., second, surface 110E oppositeinterior surface 110I. Interior surface 110I is secured to windowsupport 108 and exterior surface 110E is exposed to the ambientenvironment. Window 110 further includes sides 110S, which extendbetween exterior surface 110E and interior surface 110I.

In this embodiment, window support 108 contacts interior surface 110Ionly, or a central portion of interior surface 110I only, i.e., does notcontact sides 110S. Further, window 110 overlies active area 104 anddoes not overlie bond pads 106.

Window 110 is parallel to upper surface 102U of image sensor 102. Moreparticularly, a plane defined by interior surface 110I (or exteriorsurface 110E) is parallel to a plane defined by upper surface 102U ofimage sensor 102.

Window 110 is transparent to the radiation of interest, e.g., to theradiation to which active area 104 of image sensor 102 is responsive, asthose of skill in the art will understand. In one particular embodiment,window 110 is optically transparent borosilicate glass.

Generally, the transmittance of window support 108 and window 110 issufficient to allow the necessary minimum amount of radiation needed forthe proper operation of image sensor 102 to pass through window support108 and window 110.

During use, radiation is directed at assembly 100. This radiation passesthrough window 110, through window support 108 and strikes active area104, which responds to the radiation as is well known to those of skillin the art. However, in an alternative embodiment, active area 104 ofimage sensor 102 transmits radiation such as electromagnetic radiation.For example, image sensor 102 is a light emitting diode (LED)micro-display. In accordance with this embodiment, radiation transmittedby active area 104 passes through window support 108, through window110, and emanates from assembly 100. For simplicity, in the above andfollowing discussions, active area 104 as a receiver of radiation is setforth. However, in light of this disclosure, those of skill in the artwill recognize that generally active area 104 can be a receiver ofradiation, a transmitter of radiation, or a transceiver, i.e., atransmitter and a receiver, of radiation. Further, in the embodimentsillustrated in FIGS. 4, 5 and 6, instead of being an image sensor,sensor device 102 is a micromachine chip and active area 104 is amicromachine area containing a micromachine element.

In one embodiment, the refractive index of window support 108 is similarto the refractive index of window 110. In this manner, the sensitivityof assembly 100 is improved compared to the prior art.

Recall that in the prior art, a housing was mounted around the imagesensor and to the print circuit mother board. This housing supported awindow above the image sensor. However, located between the window andthe image sensor was air. Disadvantageously, air has a relatively lowrefractive index compared to the window. As those skilled in the artunderstand, as visible light or other electromagnetic radiation passesfrom a material having a high refractive index to a material having alow refractive index and vice versa, a significant percentage of theelectromagnetic radiation is reflected. To illustrate, for a windowhaving a refractive index of 1.52, at each window/air interface,approximately 4 percent of the electromagnetic radiation is reflected.Since the electromagnetic radiation had to pass from air, through thewindow, and back through air to reach the active area of the imagesensor in the prior art, a significant percentage of the electromagneticradiation was reflected. This resulted in an overall loss of sensitivityof prior art image sensor assemblies.

In contrast, window 110 and window support 108 of assembly 100 have asimilar refractive index. Illustratively, the difference between therefractive index of window 110 and the refractive index of windowsupport 108 is such that the amount of radiation reflected at theinterface of window 110 and window support 108 is one percent or less.As an example, window 110 has a refractive index of 1.52 and windowsupport 108 has a refractive index of 1.40. Accordingly, the amount ofreflected radiation is reduced compared to the prior art. This improvesthe sensitivity of assembly 100 compared to prior art image sensorassemblies. In one embodiment, assembly 100 is 13% more sensitive toelectromagnetic radiation than prior art image sensor assemblies.

Further, instead of having air between the window and the active area ofthe image sensor as in the prior art, window support 108 completelyfills the region between window 110 and active area 104. In other words,assembly 100 is a cavityless package, i.e., assembly 100 does not have acavity between window 110 and active area 104. Advantageously, byeliminating the prior art cavity between the active area and the window,the possibility of moisture condensation within the cavity is alsoeliminated. Accordingly, assembly 100 has no dew point.

In contrast, prior art image sensor assemblies had a dew point, i.e., atemperature at which condensation formed within the housing, whichenclosed the image sensor and supported the window. In general, moisturehad a tendency to condense within the housing and on the interiorsurface of the window. To avoid this condensation, it was important toavoid subjecting the image sensor assembly to extreme low temperatures.Disadvantageously, this limited the temperature range over which theimage sensor assembly would satisfactorily perform. Alternatively, theimage sensor assembly was fabricated in a low humidity environment toavoid trapping moisture within the housing and was hermetically sealedby the housing to keep out moisture. This added complexity, whichincreased the cost of the image sensor assembly. Further, in the eventthat the hermetic seal of the housing failed, the image sensor wasdamaged or destroyed.

Since assembly 100 does not have a dew point, assembly 100 operatessatisfactorily over a broader range of temperatures and, moreparticularly, at lower temperatures than image sensor assemblies of theprior art. Further, since assembly 100 is a cavityless package, there isno possibility that moisture will leak into assembly 100. Accordingly,the reliability of assembly 100 is greater than that of the prior art.

Further, the housing of a prior art image sensor assembly was typicallyformed of ceramic, which was relatively expensive. Advantageously,assembly 100 in accordance with the present: invention eliminates theneed for a housing of the prior art. Accordingly, assembly 100 issignificantly less expensive to manufacture than image sensor assembliesof the prior art.

Further, since window 110 is attached directly to image sensor 102 bywindow support 108, image sensor assembly 100 can be made relativelythin compared to a prior art image sensor assembly. To illustrate, a0.039 inch (1.0 mm) or less thickness for image sensor assembly 100 iseasily achievable.

In contrast, the prior art image sensor housing was relatively bulky andextended upwards from the printed circuit mother board a significantdistance, e.g., 0.100 inches (2.54 mm) to 0.120 inches (3.05 mm) ormore. Since assembly 100 can be made relatively thin, assembly 100 iswell suited for use with miniature lightweight electronic devices, whichrequire thin and lightweight image sensor assemblies.

A step up ring 120 surrounds active area 104. Step up ring 120 isceramic, printed circuit board material, or electrically insulativetape, e.g., epoxy laminated tape, although other electrically insulativematerials can be used.

A lower, e.g., first, surface 120L of step up ring 120 is attacheddirectly to upper surface 102U of image sensor 102. More particularly,upper surface 102U of image sensor 102 includes a noncritical region NCRbetween active area 104 and bond pads 106. Step up ring 120 is mountedabove noncritical region NCR and, in this embodiment, lower surface 120Lof step up ring 120 is directly attached to noncritical region NCR, forexample, with adhesive.

Electrically conductive traces 122 are formed on an upper, e.g., second,surface 120U of step up ring 120. Traces 122 are electrically connectedto corresponding bond pads 106 by corresponding electrically conductivebond wires 124. Electrically conductive interconnection balls 126, e.g.,solder, are formed on corresponding traces 122. Interconnection balls126 are used to electrically connect assembly 100 to a larger substrate(not shown) such as a printed circuit mother board having an aperturealigned with window 110.

To illustrate, a first bond pad 106A of the plurality of bond pads 106is electrically connected to a first trace 122A of the plurality oftraces 122 by a first bond wire 124A of the plurality of bond wires 124.A first interconnection ball 126A of the plurality of interconnectionballs 126 is formed on trace 122A. In this manner, interconnection ball126A is electrically connected to bond pad 106A. The other bond pads106, bond wires 124, traces 122, and interconnection balls 126 areelectrically connected to one another in a similar fashion so are notdiscussed further to avoid detracting from the principals of theinvention.

As set forth above, an electrically conductive pathway is formed betweenbond pads 106 and interconnection balls 126. However, in light of thisdisclosure, those of skill in the art will understand that otherelectrically conductive pathways can be formed. For example, contactmetallizations can be interposed between the various electricalconductors, e.g., between bond pads 106 and bond wires 124, between bondwires 124 and traces 122, and/or between traces 122 and interconnectionballs 126. As another alternative, traces 122 extends beyond sides 120Sof step up ring 120 and are directly connected to bond pads 106 and bondwires 124 are not formed. As yet another alternative, interconnectionballs 126 are distributed in an array format to form a ball grid array(BGA) type package. Alternatively, interconnection balls 126 are notformed, e.g., to form a metal land grid array (LGA) type package or aleadless chip carrier (LCC) package. Other electrically conductivepathway modifications will be obvious to those of skill in the art.

By forming interconnection balls 126 on traces 122 on upper surface 120Uof step up ring 120, interconnection balls 126 are elevated aboveexterior surface 110E of window 110.

Advantageously, use of step up ring 120 allows interconnection balls 126to have minimum size and pitch. This may be important, for example, whena large number of interconnection balls 126 must be provided in alimited area.

Step up ring 120 includes a central aperture 128. Window 110 and windowsupport 108 are located within, or are located adjacent to, centralaperture 128 such that step up ring 120 is mounted around window 110 andwindow support 108. In one embodiment, window 110 and window support 108are located within central aperture 128 and exterior surface 110E ofwindow 110 is below upper surface 120U of step up ring 120. In analternative embodiment, exterior surface 110E is coplanar with uppersurface 120U. In yet another embodiment, exterior surface 110E is aboveupper surface 120U such that window 110 protrudes from central aperture128. Generally, exterior surface 110E of window 110 is exposed throughaperture 128.

Assembly 100 further includes an inner, e.g., first, package body 140.Inner package body 140 environmentally protects, e.g., from moisture,window 110, window support 108 and active area 104. In addition, innerpackage body 140 provides mechanical strength to assembly 100 and, inparticular, minimizes failure of window 110, window support 108 and stepup ring 120.

In this embodiment, inner package body 140 fills central aperture 128 ofstep up ring 120 and encloses window support 108 and upper surface 102Uof image sensor 102 between step up ring 120 and window support 108.Generally, inner package body 140 fills between step up ring 120 andwindow support 108. Further, inner package body 140, in combination withwindow support 108, mechanically locks window 110 in place. Inparticular, inner package body 140 contacts sides 110S of window 110thus locking window 110 in place. To enhance this locking of window 110,in one embodiment, sides 110S of window 110 include a locking featuresuch as that discussed in Webster et al., co-pending and commonlyassigned U.S. patent application, Ser. No. 09/490,717, entitled“PROTECTED IMAGE SENSOR PACKAGE”, filed Jan. 25, 2000 and now U.S. Pat.No. 6,407,381, and Webster et al., co-pending and commonly assigned U.S.patent application Ser. No. 09/491,112, entitled “PROTECTED IMAGE SENSORPACKAGE FABRICATION METHOD”, filed Jan. 25, 2000, which are both hereinincorporated by reference in their entireties.

Inner package body 140 is formed of any one of a number of conventionalpackaging materials. For example, inner package body 140 is formed froma plastic encapsulant or, alternatively, a liquid encapsulant.

Assembly 100 further includes an outer, e.g., second, package body 150.Outer package body 150 electrically isolates and protects bond pads 106and bond wires 124. In particular, outer package body 150 encloses sides120S of step up ring 120, bond pads 106 and bond wires 124. In oneembodiment, outer package body 150 also contacts a periphery of uppersurface 120U of step up ring 120 adjacent sides 120S and encloses theends of traces 122 thus enhancing the bond between bond wires 124 andtraces 122.

Advantageously, assembly 100 is the size of image sensor 102, i.e.,assembly 100 is chip size. Stated another way, outer package body 150has outer sides 150S coplanar with sides 102S of image sensor 102. Sinceassembly 100 is chip size, assembly 100 is extremely well suited for usewith miniature lightweight electronic devices, which require small andlightweight image sensor assemblies.

FIG. 3 is a cross-sectional view of an image sensor assembly 300(hereinafter assembly 300) in accordance with an alternative embodimentof the present invention. Assembly 300 of FIG. 3 is similar to assembly100 of FIG. 2 and only the significant differences are discussed below.

Referring now to FIG. 3, in this embodiment, formed on upper surface102U of image sensor 102 is a window support 308. Window support 308 istransparent to the radiation of interest in a manner similar to thatdescribed above with regards to window support 108 of assembly 100 ofFIG. 2. See also, Glenn et al., co-pending and commonly assigned U.S.patent application Ser. No. 09/610,314, entitled “WAFER SCALE IMAGESENSOR PACKAGE”, filed Jul. 5, 2000 and Glenn et al., co-pending andcommonly assigned U.S. patent application Ser. No. 09/610,309, entitled“WAFER SCALE IMAGE SENSOR PACKAGE FABRICATION METHOD”, filed Jul. 5,2000, which are both herein incorporate by reference in theirentireties.

Window support 308 entirely contacts and entirely encloses upper surface102U including active area 104 and bond pads 106. More particularly,window support 308 has a lower, e.g., first, surface 308L in contactwith upper surface 102U of image sensor 102. Window support 308 furtherhas an upper, e.g., second, surface 308U, opposite lower surface 308L.Extending between upper surface 308U and lower surface 308L are sides308S of window support 308. Sides 308S are coplanar with sides 102S ofimage sensor 102 and are also coplanar with sides 150S of an outerpackage body 150A.

Interior surface 110I of window 110 is secured to upper surface 308U ofwindow support 308. Further, in accordance with this embodiment, lowersurface 120L of a step up ring 120A is also secured to upper surface308U of window support 308 such that step up ring 120A is mounted abovenoncritical region NCR of upper surface 102U of image sensor 102. Innerpackage body 140A fills the region between step up ring 120A and window110 and, accordingly, contacts upper surface 308U of window support 308between step up ring 120A and window 110.

As set forth above, window support 308 entirely encloses bond pads 106.Bond wires 124 pass through window support 308 to bond pads 106, e.g.,bond wires 124 break through window support 308 to bond pads 106 fromheat and mechanical energy during the wirebonding process. Outer packagebody 150A is formed on upper surface 308U of window support 308 andencloses bond wires 124.

FIG. 4 is a cross-sectional view of an image sensor assembly 400(hereinafter assembly 400) in accordance with an alternative embodimentof the present invention. Assembly 400 of FIG. 4 is similar to assembly100 of FIG. 2 and only the significant differences are discussed below.

Referring now to FIG. 4, a window support 408 is formed on noncriticalregion NCR. More particularly, window support 408 is attached to,supported by, and contacts noncritical region NCR around active area 104yet does not extend over active area 104. In this embodiment, windowsupport 408 is an epoxy bead, e.g., a bead formed of a B-staged epoxy,which has been setup, i.e., cured, gelled, or made tacky. In oneparticular embodiment, window support 408 is Masterbond 150 manufacturedby Masterbond, Inc. or Hysol 4451 manufactured by Dexter Corporationlocated in Industry, Calif.

Window support 408 contacts a peripheral region PR of interior surface110I of window 110. Peripheral region PR of interior surface 110I isdirectly adjacent sides 110S and surrounds a central region CR ofinterior surface 110I. Window 110 and, more particularly, central regionCR of interior surface 110I of window 110 overlies active area 104.

Window support 408 forms a seal between peripheral region PR of interiorsurface 110I of window 110 and noncritical region NCR of upper surface102U of image sensor 102. Thus, window 110, window support 408, andimage sensor 102 define a cavity 418, which is sealed. In particular,active area 104 is located within cavity 418, which is sealed to protectactive area 104 against external moisture, dust and contamination.Generally, cavity 418 contains a medium 420, which is transparent to theradiation of interest. For example, medium 420 is air.

Advantageously, the volume of cavity 418 is relatively small. Byminimizing the volume of cavity 418, the amount of any moisture trappedwithin cavity 418 is also minimized. This, in turn, essentiallyeliminates the possibility of moisture condensation on interior surface110I of window 110 or active area 104 of image sensor. 102. As a result,assembly 400 has a very low or nonexistent dew point.

In this embodiment, inner package body 140 fills central aperture 128 ofstep up ring 120 and encloses window support 408 and upper surface 102Uof image sensor 102 between step up ring 120 and window support 408, ina manner similar to that described with regards to assembly 100 of FIG.2.

FIG. 5 is a cross-sectional view of image sensor assembly 500(hereinafter assembly 500) in accordance with another alternativeembodiment of the present invention. Assembly 500 of FIG. 5 is similarto assembly 400 of FIG. 4 and only the significant differences arediscussed below.

Referring to FIG. 5, in this embodiment, a window support 508 is arectangular, e.g., square, ring, i.e., is a rectangular block having arectangular hole extending through the middle. An upper, e.g., first,surface 508U of window support 508 is attached to peripheral region PRof interior surface 110I of window 110, for example, with an epoxyadhesive or tape. Window 110 and window support 508 thus form aninverted cut shape enclosure.

In one embodiment, window support 508 is formed of the same material asthe material of window 110, e.g., borosilicate glass. By forming windowsupport 508 and window 110 of the same material, stress generatedbetween window 110 and window support 508, e.g., due to differences inthermal expansion, are minimized or eliminated.

A lower, e.g., second, surface 508L of window support 508 is attached tononcritical region NCR of upper surface 102U of image sensor 102 aroundactive area 104 by an adhesive layer 542. Illustratively, adhesive layer542 is QMI 536 or QMI 550 manufactured by Quantum Materials located inSan Diego, Calif.

FIG. 6 as a cross-sectional view of an image sensor assembly 600(hereinafter assembly 600) in accordance with yet another alternativeembodiment of the present invention. Package 600 of FIG. 6 is similar topackage 400 of FIG. 4 and only the significant differences are discussedbelow.

Referring to FIG. 6, window support 608 is a rectangular, e.g., square,ring. However, in this embodiment, window support 608 and window 110 areintegral, i.e., are formed of a single piece and not of a plurality ofseparate pieces connected together. A lower, e.g., first, surface 608Lof window support 608 is attached to noncritical region NCR of uppersurface 102U of image sensor 102 around active area 104 by an adhesivelayer 542A.

Illustratively, window support 608 and window 110 are formed from asingle integral sheet, e.g., of borosilicate glass, using a method asdescribed in Glenn et al., co-pending and commonly assigned U.S. patentapplication Ser. No. 09/577,692, entitled “IMAGE SENSOR PACKAGE HAVINGSEALED CAVITY OVER ACTIVE AREA”, filed May 22, 2000, and Glenn et al.,co-pending and commonly assigned U.S. patent application Ser. No.09/576,595 entitled “METHOD OF FORMING AN IMAGE SENSOR PACKAGE HAVINGSEALED CAVITY OVER ACTIVE AREA”, filed May 22, 2000, which are bothherein incorporated by reference in their entireties.

FIG. 7A is a cross-sectional view of a structure 700A during thefabrication of a plurality of assemblies 100 (FIGS. 1, 2) in accordancewith one embodiment of the present invention. Structure 700A includes animage sensor substrate 702 such as a silicon wafer. Image sensorsubstrate 702 includes a plurality of image sensors 102 integrallyconnected together in an array format. Each of image sensors 102 aredelineated by a singulation street 704, which is located betweenadjacent image sensors 102.

As shown in FIG. 7A, windows 110 are mounted above active areas 104 bywindow supports 108. For example, a first image sensor 102A of theplurality of image sensors 102 has a first active area 104A of theplurality of active areas 104. A first window 110A of the plurality ofwindows 110 is mounted above active area 104A by a first window support108A of the plurality of window supports 108. The other windows 110 aresimilarly mounted above the other corresponding active areas 104 by theother corresponding window supports 108. Illustratively, structure 700Ais fabricated as described in Webster et al., U.S. patent applicationSer. No. 09/491,112, cited above.

FIG. 7B is a cross-sectional view of a structure 700B during thefabrication of a plurality of assemblies 300 (FIG. 3) in accordance withan alternative embodiment of the present invention. Structure 700B ofFIG. 7B is similar to structure 700A of FIG. 7A and only the significantdifferences are discussed below. In accordance with this alternativeembodiment, a single window support layer 750 is formed on an upper,e.g., first, surface 702U of image sensor substrate 702. Windows 110 aremounted above active areas 104 by window support layer 750,illustratively, as described in Glenn et al., U.S. patent applicationSer. No. 09/610,309, cited above. For example, window 110A is mountedabove active area 104A by window support layer 750.

FIGS. 7C, 7D and 7E are cross-sectional views of structures 700C, 700D,700E during the fabrication of a plurality of assemblies 400, 500, 600(FIGS. 4, 5, 6), respectively, in accordance with alternativeembodiments of the present invention. Structures 700C, 700D, 700E ofFIGS. 7C, 7D and 7E are similar to structure 700A of FIG. 7A and onlythe significant differences are discussed below.

Referring now to FIG. 7C, windows 110 are mounted above active areas 104by window supports 408. To illustrate, window 110A is mounted aboveactive area 104A by a first window support 408A of the plurality ofwindow supports 408.

Referring now to FIGS. 7D, 7E, windows 110 are mounted above activeareas 104 by window supports 508, 608 and adhesive layers 542, 542A,respectively. To illustrate, referring to FIG. 7D, window 110A ismounted above active area 104A by a first window support 508A of theplurality of window supports 508 and by a first adhesive layer 542-1 ofthe plurality of adhesive layers 542. Similarly, referring to FIG. 7E,window 110A is mounted above active area 104A by a first window support608A of the plurality of window supports 608 and by a first adhesivelayer 542-1A of the plurality of adhesive layers 542A. Illustratively,structures 700C, 700D, 700E are fabricated as described in Glenn et al.,U.S. patent application Ser. No. 09/576,595, cited above.

FIG. 8A is a cross-sectional view of structure 700A of FIG. 7A at afurther state of fabrication. Referring to FIG. 8A, step up rings 120are mounted above upper surface 702U of image sensor substrate 702, forexample with adhesive. Stated another way, lower surfaces 120L of stepup rings 120 are mounted above noncritical regions NCR on upper surfaces102U of image sensors 102. More particularly, lower surfaces 120L ofstep up rings 120 are mounted directly to noncritical regions NCR onupper surfaces 102U of image sensors 102. Step up rings 120 are mountedaround window supports 108 and windows 110 such that window supports 108and windows 110 are located in or adjacent central apertures 128 of stepup rings 120.

To illustrate, a lower surface 120L of a first step ring 120-1 of theplurality of step up rings 120 is directly mounted to noncritical regionNCR on upper surface 102U of image sensor 102A. Step up ring 120-1 ismounted around window 110A and window support 108A such that windowsupport 108A and window 110A are located in or adjacent central aperture128 of step up ring 120-1. The other step up rings 120 are mounted abovethe other corresponding noncritical regions NCR on upper surfaces 102Uof image sensors 102 in a similar manner.

In one embodiment, step up rings 120 are individual pieces, which aremounted one at a time, i.e., sequentially. In another embodiment, stepup rings 120 are individual pieces, which are all mounted at the sametime, i.e., simultaneously.

In yet another embodiment, a single sheet 804, e.g., of epoxy laminatedtape, includes a plurality of step up rings 120 integrally connected toone another, for example, with bridge portions 806 (indicated in dashedlines). In accordance with this embodiment, a lower, e.g., first,surface 804L of sheet 804 is mounted to upper surface 702U of imagesensor substrate 702, thus mounting step up rings 120 above noncriticalregions NCR of image sensors 102 and around window supports 108 andwindows 110.

In FIG. 8A, mounting of step up rings 120 around windows 110 and windowsupports 108 is illustrated. However, in accordance with the alternativeembodiment illustrated in FIG. 7C, step up rings 120 are mounted aroundwindows 110 and window supports 408 in a similar manner. Further, inaccordance with the alternative embodiments illustrated in FIGS. 7D, 7E,step up rings 120 are mounted around windows 110, window supports 508,608 and adhesive layers 542, 542A, respectively, in a similar manner.

FIG. 8B is a cross-sectional view of structure 700B of FIG. 7B at afurther state of fabrication. Lower surfaces 120L of step up rings 120Aare mounted above noncritical regions NCR on upper surfaces 102U ofimage sensors 102, for example with adhesive. More particularly, lowersurfaces 120L of step up rings 120A are mounted directly to an uppersurface 750U of window support layer 750 above noncritical regions NCR.Step up rings 120A are mounted around windows 110 such that windows 110are located in or adjacent central apertures 128 of step up rings 120A.

To illustrate, a lower surface 120L of a first step up ring 120-1A ofthe plurality of step up rings 120A is mounted directly to upper surface750U of window support layer 750 above noncritical region NCR on uppersurface 102U of image sensor 102A. Step up ring 120-1A is mounted aroundwindow 110A such that window 110A is located in or adjacent centralaperture 128 of step up ring 120-1A. The other step up rings 120A aremounted above the other corresponding noncritical regions NCR on uppersurfaces 102U of image sensors 102 in a similar manner.

FIGS. 9, 10, and 11 illustrate the fabrication of a plurality ofassemblies 100 (FIGS. 1, 2). However, it is understood that a pluralityof assemblies 300, 400, 500, 600 (FIGS. 3, 4, 5, 6, respectively) arefabricated in a similar manner as that illustrated in FIGS. 9, 10, and11 and so fabrication of assemblies 300, 400, 500, 600 is not discussedfurther to avoid attracting from the principals of the invention.

FIG. 9 is a cross-sectional view of structure 700A of FIG. 8A at afurther stage of fabrication. Referring to FIG. 9, traces 122 on uppersurfaces 120U of step up rings 120 are electrically connected to bondpads 106 of image sensors 102 by bond wires 124.

FIG. 10 is a cross-sectional view of structure 700A of FIG. 9 at afurther stage of fabrication. Referring to FIG. 10, inner package bodies140 are formed. To illustrate, a first inner package body 140-1 of theplurality of inner package bodies 140 is formed by encapsulant fillingbetween step up ring 120-1 and window support 108A/window 110A. Moregenerally, central aperture 128 of step up ring 120-1 is filled withencapsulant to form inner package body 140-1. For example, centralaperture 128 is filled with a liquid encapsulant, which is cured to forminner package body 140-1. Alternatively, central aperture 128 is filledwith a plastic encapsulant to form inner package body 140-1. The otherinner package bodies 140 are formed in a similar manner simultaneously,or alternatively, sequentially.

Referring still to FIG. 10, outer package bodies 150 are formed. Outerpackage bodies 150 are formed by encapsulant filling between step uprings 120. For example, the regions between step up rings 120 are filledwith a liquid encapsulant, which is cured to form outer package bodies150. Alternatively, the regions between step up rings 120 are filledwith a plastic encapsulant to form outer package bodies 150.

After formation of package bodies 150, in one embodiment, a lower, e.g.,second surface 702L of image sensor substrate 702 is back lapped, i.e.,ground down. Back lapping lower surface 702L reduces the thickness ofimage sensor substrate 702 and, correspondingly, results in a minimumthickness. for assembly 100 (FIG. 2).

FIG. 11 is a cross-sectional view of structure 700A of FIG. 10 at afurther stage of fabrication. Referring now to FIG. 11, interconnectionballs 126 are formed on traces 122. In one embodiment, after formationof interconnection balls 126, each assembly 100 is tested for validity,i.e., to determine whether the assembly 100 is defective or not.Advantageously, testing each assembly 100 while still in wafer form,i.e., before singulation of image sensor substrate 702, is less laborintensive and less complex than testing each assembly 100 individually.

After formation of interconnection balls 126 and, optionally, validitytesting assemblies 100, image sensor substrate 702 is singulated alongsingulation streets 704 resulting in a plurality of assemblies 100(FIGS. 1, 2). Alternatively, interconnection balls 126 are formed ontraces 122 after image sensor substrate 702 is singulated. Although theformation of a plurality of assemblies 100 simultaneously is describedabove, it is understood that assemblies 100 can be fabricated on anindividual basis, if desired. FIG. 12 is a cross-sectional view of animage sensor assembly 1200 (hereinafter assembly 1200) in accordancewith an alternative embodiment of the present invention. Assembly 1200of FIG. 12 is similar to assembly 100 of FIG. 2 and only the significantdifferences are discussed below.

Referring now to FIG. 12, a step up ring 120B is flip chip mounted toimage sensor 102. More particularly, formed on lower surface 120L ofstep up ring 120B are a plurality of electrically conductive interior,e.g., first, traces 1214, which include a first interior trace 1214A.Bond pads 106 are electrically connected to corresponding interiortraces 1214 by corresponding electrically conductive bumps 1212,sometimes called flip chip bumps 1212. Illustratively, bumps 1212 are:(1) stud bumps, i.e., gold balls; (2) electrically conductive epoxypaste; (3) electrically conductive epoxy film; or (4) solder. Generally,step up ring 120B is mounted to image sensor 102 by bumps 1212.

Traces 122, sometimes called exterior or second traces 122, on uppersurface 120U of step up ring 120B are electrically connected tocorresponding interior traces 1214 by corresponding electricallyconductive vias 1218. Vias 1218 extend through step up ring 120B fromlower surface 120L to upper surface 120U.

To illustrate, bond pad 106A is electrically and physically connected tointerior trace 1214A by a first bump 1212A of the plurality of bumps1212. Interior trace 1214A is electrically connected to trace 122A by afirst via 1218A of the plurality of vias 1218. Formed on trace 122A isinterconnection ball 126A.

Advantageously, step up ring 120B is readily flip chip mounted to imagesensor 102, which can have a wide variety of arrangements of bond pads106. Illustratively, bond pads 106 are arranged in rows adjacent sides102S of image sensor 102 (see FIG. 1, for example). Alternatively, bondpads 106 are distributed, e.g., in an array, on upper surface 102U ofimage sensor 102.

Referring still to FIG. 12, a package body 1240 fills central aperture128 of step up ring 120B and encloses window support 108. Package body1240 is formed of any one of a number of underfill materials commonlyused in flip chip processing.

In this embodiment, due to the flip chip mounting of step up ring 120B,a space exists between lower surface 120L of step up ring 120B and uppersurface 102U of image sensor 102. Package body 1240 fills this spacebetween lower surface 120L of step up ring 120B and upper surface 102Uof image sensor 102. Package body 1240 extends to sides 102S of imagesensor 102 such that sides 120S of step up ring 120B, sides 1240S ofpackage body 1240 and sides 102S of image sensor 102 are coplanar.

As shown in FIG. 12, package body 1240 also encloses bumps 1212. Packagebody 1240 enhances the reliability of assembly 1200 by preventing thefailure of bumps 1212 and preventing the associated dismounting of stepup ring 120B. For example, package body 1240 insures that step up ring120B does not become dismounted from image sensor 102 as a result of anydifferential thermal extension between step up ring 120B and imagesensor 102.

In FIG. 12, window 110 is mounted to image sensor 102 by window support108. However, in alternative embodiments, instead of using windowsupport 108 to mount window 110, window support 308, 408, 508, or 608 ofFIG. 3, 4, 5, or 6, respectively, is used to mount window 110 to imagesensor 102.

FIG. 13 is a cross-sectional view of structure 700A of FIG. 7A at alater stage during fabrication of a plurality of assemblies 1200 (FIG.12) in accordance with one embodiment of the present invention. A singlesheet 1310 comprises a plurality of step up rings 120B integrallyconnected together. Sheet 1310 is mounted to image sensor substrate 702by bumps 1212.

To form bumps 1212 and thus mount sheet 1310, sheet 1310 is aligned withimage sensor substrate 702 using any one of a number of alignmenttechniques, e.g., sheet 1310 is optically or mechanically aligned. Moreparticularly, interior traces 1214 on lower surfaces 120L of step uprings 120B are aligned with corresponding bond pads 106. Bumps 1212 areformed between interior traces 1214 and bond pads 106 thus mountingsheet 1310 to image sensor substrate 702 and, more specifically,mounting step up rings 120B to corresponding image sensors 102.

To illustrate, a first interior trace 1214A is formed on lower surface120L of a first step up ring 120-1B of the plurality of step up rings120B. Interior trace 1214A is aligned with bond pad 106A. Bump 1212A isformed between interior trace 1214A and bond pad 106A. Bump 1212A.physically and electrically connects interior trace 1214A to bond pad106A thus flip chip mounting step up ring 120-1B to image sensor 102A.The other step up ring 120B are flip chip mounted to the other imagesensors 102 in a similar manner.

Bumps 1212 are formed using any one of a number of techniques. Forexample, solder bumps are formed on bond pads 106 of image sensors 102or on interior traces 1214, and these solder bumps are reflowed to formbumps 1212. Alternatively, bumps 1212 are formed by applying anelectrically conductive epoxy paste or film to bond pads 106 or interiortraces 1214 and thermally or optically curing this electricallyconductive epoxy paste or film. As a further alternative, bumps 1212 areformed by thermal or thermosonic bonding of gold bumps formed on bondpads 106 or on interior traces 1214. In light of this disclosure, thoseof skill in the art will understand that other methods of attachingsheet 1310 to image sensor substrate 702 can be used.

Advantageously, bumps 1212 are formed simultaneously reducing labor andincreasing efficiency compared to wirebonding each bond pad 106sequentially. In this manner, the cost of fabricating assembly 1200(FIG. 12) is minimized.

FIG. 14 is a cross-sectional view of structure 700A of FIG. 13 at afurther stage of fabrication. As shown in FIG. 14, package bodies 1240are formed to enclose window supports 108, bumps 1212 and generally tofill the space between sheet 1310 and image sensor substrate 702. Toillustrate, a first package body 1240A of the plurality of packagebodies 1240 is formed by underfilling between step up ring 120-1B andimage sensor 102A and around window support 108A/window 110A.

To avoid trapping air underneath sheet 1310, in one embodiment, anunderfill material is applied into a central aperture 128 of a firststep up ring 120B of sheet 1310 and allowed to flow between sheet 1310and image sensor substrate 702 to the adjacent central apertures 128 ofthe adjacent step up rings 120B of sheet 1310. This allows the air inthe space between sheet 1310 and image sensor substrate 702 to bedisplaced, instead of trapped, by the underfill material.

To illustrate, underfill material is applied into a central aperture 128of step up ring 120-1B around window 110A and window support 108A asindicated by arrows 1410. This underfill material flows from centralaperture 128 of step up ring 120-1B between sheet 1310 and image sensorsubstrate 702 to central apertures 128 of the adjacent step up rings120B. As this underfill material flows, air is displaced and escapesthrough central apertures 128 of the adjacent step up rings 120B asindicated by arrows 1420. The underfill material is then cured, ifnecessary, to form package bodies 1240.

After formation of package bodies 1240, in one embodiment, image sensorsubstrate 702 is back lapped, i.e., lower surface 702L is ground down.Each assembly 1200 is tested for validity. Image sensor substrate 702 issingulated along singulation streets 704. Alternatively, interconnectionballs 126 are formed on corresponding traces 122 in a manner similar tothat illustrated in FIG. 11, and, after formation of interconnectionballs 126, image sensor substrate 702 is singulated. In eitherembodiment, sheet 1310 is singulated into step up rings 120B duringsingulation of image sensor substrate 702. However, in an alternativeembodiment, instead of mounting a single sheet 1310 comprising aplurality of step up rings 120B integrally connected together, step uprings 120B are mounted individually as individual pieces sequentially orsimultaneously to image sensor substrate 702.

In FIGS. 13 and 14, windows 110 are mounted to image sensors 102 bywindow supports 108. However, in alternative embodiments, instead ofusing window supports 108 to mount windows 110, window supports 308,408, 508, or 608 of FIG. 3, 4, 5, or 6, respectively, are used to mountwindows 110 to image sensors 102.

This application is related to Glenn et al., co-filed and commonlyassigned U.S. patent application Ser. No. 09/712,314, entitled “CHIPSIZE IMAGE SENSOR WIREBOND PACKAGE FABRICATION METHOD”; Glenn et al.,co-filed and commonly assigned U.S. patent application Ser. No.09/712,313, entitled “CHIP SIZE IMAGE SENSOR BUMPED PACKAGE”; and Glennet al., co-filed and commonly assigned U.S. patent application Ser. No.09/711,994, entitled “CHIP SIZE IMAGE SENSOR BUMPED PACKAGE FABRICATIONMETHOD”, which are all herein incorporated by reference in theirentireties.

The drawings and the forgoing description gave examples of the presentinvention. The scope of the present invention, however, is by no meanslimited by these specific examples. Numerous variations, whetherexplicitly given in the specification or not, such as differences instructure, dimension, and use of material, are possible. The scope ofthe invention is at least as broad as given by the following claims.

We claim:
 1. An assembly comprising: a sensor device having a firstsurface, said sensor device comprising: an active area on said firstsurface; and a bond pad on said first surface, wherein a noncriticalregion of said first surface is between said active area and said bondpad; a step up ring above said noncritical region; and an electricallyconductive trace on said step up ring, wherein said bond pad iselectrically connected to said trace.
 2. The assembly of claim 1 whereinsaid sensor device is an image sensor.
 3. The assembly of claim 2wherein said active area is responsive to radiation.
 4. The assembly ofclaim 1 further comprising: a window; and a window support supportingsaid window above said active area.
 5. The assembly of claim 4 furthercomprising a package body between said step up ring and said windowsupport.
 6. The assembly of claim 5 wherein said step up ring comprisesa central aperture, said package body filling said central aperture andenclosing said window support.
 7. The assembly of claim 4 wherein saidstep up ring comprises a central aperture, said window and windowsupport being located within or adjacent to said central aperture. 8.The assembly of claim 1 wherein a first surface of said step up ring isattached directly to said first surface of said sensor device, saidtrace being on a second surface of said step~up ring.
 9. The assembly ofclaim 1 further comprising an interconnection ball on said trace. 10.The assembly of claim 9 wherein said interconnection ball iselectrically connected to said bond pad.
 11. The assembly of claim 1wherein a size of said assembly is the same as a size of said sensordevice.
 12. The assembly of claim 1 further comprising: a bond wireelectrically connecting said bond pad to said trace; and a package bodyenclosing said bond pad, said bond wire and sides of said step up ring.13. The assembly of claim 12 wherein said package body has outer sidescoplanar with sides of said sensor device.
 14. The assembly of claim 1further comprising: a window; and a window support supporting saidwindow above said active area, wherein a first surface of said windowsupport contacts said first surface of said sensor device, a firstsurface of said step up ring being secured to a second surface of saidwindow support.
 15. The assembly of claim 14 wherein said window supportentirely contacts and entirely encloses said first surface of saidsensor device.
 16. The assembly of claim 15 wherein said window supportcomprises sides coplanar with sides of said sensor device.
 17. Theassembly of claim 16 wherein said assembly further comprises a package.body having sides coplanar with said sides of said window support. 18.The assembly of claim 1 further comprising an image sensor substratecomprising a plurality of image sensors integrally connected together,said plurality of image sensors comprising said sensor device.
 19. Anassembly comprising: a sensor device having an active area on a firstsurface of said sensor device; a window; a window support supportingsaid window above said active area; and a step up ring having a firstsurface attached directly to said first surface of said sensor device,said step up ring being mounted around said window and window support.20. The assembly of claim 19 wherein said first surface of said step upring is attached directly to said first surface of said sensor device byadhesive.
 21. The assembly of claim 19 wherein said sensor devicecomprises a bond pad on said first surface of said sensor device, anoncritical region of said first surface of said sensor device beingbetween said active area and said bond pad, said first surface of saidstep up ring being attached directly to said noncritical region.
 22. Theassembly of claim 21 further comprising an electrically conductive traceon a second surface of said step up ring, said bond pad beingelectrically connected to said trace.
 23. The assembly of claim 22further comprising a bond wire between said bond pad and said trace. 24.The assembly of claim 22 further comprising an interconnection ball onsaid trace.
 25. The assembly of claim 19 wherein said window supportcompletely fills a region between said window and said active area. 26.The assembly of claim 19 wherein said window support is formed aroundsaid active area.
 27. The assembly of claim 26 wherein said windowsupport is an epoxy bead.
 28. The assembly of claim 26 wherein saidwindow, said window support, and said sensor device define a sealedcavity, said active area being located within said sealed cavity. 29.The assembly of claim 26 wherein said window support and said window areformed of a same material.
 30. The assembly of claim 29 wherein saidmaterial is borosilicate glass.
 31. The assembly of claim 19 furthercomprising an image sensor substrate comprising a plurality of imagesensors integrally connected together, said plurality of image sensorscomprising said sensor device.
 32. An assembly comprising: a sensordevice having an active area on a first surface of said sensor device; awindow; a window support supporting said window above said active area,said window support having a first surface in contact with said firstsurface of said sensor device; and a step up ring having a first surfaceattached directly to a second surface of said window support, said stepup ring being mounted around said window.
 33. The assembly of claim 32wherein said sensor device comprises a bond pad on said first surface ofsaid sensor device, a noncritical region of said first surface of saidsensor device being between said active area and said bond pad, saidstep up ring being mounted above said noncritical region.
 34. Theassembly of claim 33 further comprising an electrically conductive traceon a second surface of said step up ring, said bond pad beingelectrically connected to said trace.
 35. The assembly of claim 34further comprising a bond wire between said bond pad and said trace. 36.The assembly of claim 34 further comprising an interconnection ball onsaid trace.
 37. The assembly of claim 32 further comprising an imagesensor substrate comprising a plurality of image sensors integrallyconnected together, said plurality of image sensors comprising saidsensor device.